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Infrared reflectance of anisotropic (110) YBCO epitaxial film

✍ Scribed by S. Kamba; J. Petzelt; V. Železný; E.V. Pechen; S.I. Krasnosvobodtsev; B.P. Gorshunov


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
389 KB
Volume
70
Category
Article
ISSN
0038-1098

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Infrared reflectivity measurements were performed on undoped and Si-doped GaN films grown on sapphire. After analysing the substrate reflectance accurately, a good fit to the measured reflectance has been achieved. By comparison of the measured and calculated spectra, it becomes possible to identify