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Infrared Imaging of the Nanometer-Thick Accumulation Layer in Organic Field-Effect Transistors

✍ Scribed by Li, Z. Q.; Wang, G. M.; Sai, N.; Moses, D.; Martin, M. C.; Di Ventra, M.; Heeger, A. J.; Basov, D. N.

Book ID: 127084732
Publisher: American Chemical Society
Year: 2006
Tongue: English
Weight: 231 KB
Volume: 6
Category: Article
ISSN: 1530-6984
DOI: 10.1021/nl052166+

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