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Infrared external reflection spectroscopy of self-assembled monolayer films on Si substrate with a buried metal layer (BML) structure

✍ Scribed by Yoshihiro Kobayashi; Toshio Ogino


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
452 KB
Volume
100-101
Category
Article
ISSN
0169-4332

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