Infrared Ellipsometry – a Novel Tool for Characterization of Group-III Nitride Heterostructures for Optoelectronic Device Applications

✍ Scribed by M. Schubert; A. Kasic; S. Einfeldt; D. Hommel; U. Köhler; D.J. As; J. Off; B. Kuhn; F. Scholz; J.A. Woollam

• Publisher: John Wiley and Sons
• Year: 2001
• Tongue: English
• Weight: 450 KB
• Volume: 228
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/1521-3951(200111)228:2<437::aid-pssb437>3.0.co;2-e