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Infra-red microscopy of Cd(Zn)Te radiation detectors revealing their internal electric field structure under bias

✍ Scribed by De Antonis, P.; Morton, E.J.; Podd, F.J.W.


Book ID
121340992
Publisher
IEEE
Year
1996
Tongue
English
Weight
473 KB
Volume
43
Category
Article
ISSN
0018-9499

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