Influences of Microstructure on Critical Current Properties in $\hbox{MgB}_{2}/\hbox{Al}$ Film

✍ Scribed by Shimada, Y.; Kubota, Y.; Hata, S.; Ikeda, K.; Nakashima, H.; Doi, T.; Fujiyoshi, T.

• Book ID: 121649824
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 756 KB
• Volume: 23
• Category: Article
• ISSN: 1051-8223
• DOI: 10.1109/TASC.2013.2238284