𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Influence of wearplate and coupling layer thickness on ultrasonic velocity measurement

✍ Scribed by A. Vincent


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
513 KB
Volume
25
Category
Article
ISSN
0041-624X

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Influence of damage on ultrasonic veloci
✍ Ulf Stigh πŸ“‚ Article πŸ“… 1987 πŸ› Elsevier Science 🌐 English βš– 854 KB

Measurements of ultrasonic velocity in creep damaged material are reviewed. The influence of damage on ultrasonic velocity is analysed and the relation between them is derived. It is shown that measurements of ultrasonic velocity can be used to predict the remaining life. Measurements of ultrasonic

Influence of electrical source impedance
✍ Daizo Sasaki; Kazuhiko Imano; Hiroshi Inoue πŸ“‚ Article πŸ“… 2001 πŸ› John Wiley and Sons 🌐 English βš– 264 KB πŸ‘ 2 views

## Abstract In acoustic velocity measurement using ultrasonic waves, the composite resonator method with the sample and the transducer becomes a source of error. This phenomenon is considered as a phase shift at the boundary between the transducer and the sample and is analyzed by numerical simulat

Influence of Profile Parameters on the I
✍ Dipl.-Ing. Ch. Quick; Dr. E. Hild; Dr.-Ing. P. Schley; Dr.-Ing. J. Quick πŸ“‚ Article πŸ“… 1991 πŸ› John Wiley and Sons 🌐 English βš– 323 KB πŸ‘ 2 views

For IR thickness measurements of very thin silicon epitaxial layers (dep, < 3 pm) on silicon substrate the influence of the concentration profile of free carriers in the whole system is not negligible. The effects of most important profile parameters on the IR reflectance spectrum of silicon epitaxi