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Influence of User-Controlled Parameters in Alpha Particle-Induced Single-Event Error Rates in Commercial SRAM Cells

✍ Scribed by Chatterjee, Indranil; Bhuva, Bharat L.; Wen, Shi-Jie; Wong, Richard


Book ID
118067751
Publisher
IEEE
Year
2012
Tongue
English
Weight
979 KB
Volume
59
Category
Article
ISSN
0018-9499

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