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Influence of total-dose radiation on the electrical characteristics of SOI MOSFETs

✍ Scribed by J.A. Felix; J.R. Schwank; C.R. Cirba; R.D. Schrimpf; M.R. Shaneyfelt; D.M. Fleetwood; P.E. Dodd

No coin nor oath required. For personal study only.

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