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Influence of thickness on field emission characteristics of AlN thin films

โœ Scribed by Y.X. Wang; Y.A. Li; W. Feng; W.Q. Li; C.H. Zhao; L.H. Liu; K.C. Feng; Y.N. Zhao

Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
377 KB
Volume
243
Category
Article
ISSN
0169-4332

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