Copper 2p,,, x-ray photoemission spectroscopy (XPS) measurements and near-edge x-ray absorption spectroscopy (NEXAFS) studies of copperdoped ZnO thin films were carried out in order to understand the role of the dopants in increasing the 6lm resistivity. c-Axis-oriented ZnO films (thickness 120 nm)
✦ LIBER ✦
Influence of the type of dopant on the Néel temperature of copper oxides
✍ Scribed by S.G. Ovchinnikov
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 277 KB
- Volume
- 228
- Category
- Article
- ISSN
- 0921-4534
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