✦ LIBER ✦
Influence of the testing environment in bipolar transistors radiation resistance results: A benchmark exercise
✍ Scribed by M. Decréton; A. Benemann; R. Sharp; S. Coenen; D. Van Beckhoven; J. Podgorski; L. Pater
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 399 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0026-2714
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