✦ LIBER ✦
Influence of the Silicon Substrate on Defect Formation in MCT Grown on II-VI Buffered Si Using a Combined Molecular Beam Epitaxy/Metal Organic Vapor Phase Epitaxy Technique
✍ Scribed by Janet E. Hails; Andrew M. Keir; Andrew Graham; Gerald M. Williams; Jean Giess
- Book ID
- 107453862
- Publisher
- Springer US
- Year
- 2007
- Tongue
- English
- Weight
- 356 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0361-5235
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