✦ LIBER ✦
Influence of the series resistance of on-chip power supply buses on internal device failure after ESD stress [MOS devices]
✍ Scribed by Terletzki, H.; Nikutta, W.; Reczek, W.
- Book ID
- 114535258
- Publisher
- IEEE
- Year
- 1993
- Tongue
- English
- Weight
- 322 KB
- Volume
- 40
- Category
- Article
- ISSN
- 0018-9383
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