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Influence of the punch diameter and curvature on the yield pressure of MCC-compacts during Heckel analysis

✍ Scribed by Filip Kiekens; Ann Debunne; Chris Vervaet; Lieven Baert; Filip Vanhoutte; Ivo Van Assche; Francois Menard; Jean Paul Remon


Book ID
113591320
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
364 KB
Volume
22
Category
Article
ISSN
0928-0987

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The influence of Ar pressure on depth resolution during glow discharge optical emission spectroscopy (GDOES) depth profiling has been examined through the use of 358 nm thick anodic alumina films grown over flat aluminium surfaces. The films are ideal standards for the present purpose, being amorpho