𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Influence of the deposition parameters on the composition, structure and X-ray photoelectron spectroscopy spectra of TiN films

✍ Scribed by M.V. Kuznetsov; M.V. Zhuravlev; E.V. Shalayeva; V.A. Gubanov

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
659 KB
Volume
215
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of the Optical Properti
Characterization of the Optical Properties and Composition of TiNxThin Films by Spectroscopic Ellipsometry and X-ray Photoelectron Spectroscopy
✍ Bendavid, A.; Martin, P. J.; Netterfield, R. P.; Kinder, T. J. 📂 Article 📅 1996 🏛 John Wiley and Sons 🌐 English ⚖ 535 KB

Thin films of TiN, with 0.34 < x < 1.19 were deposited on silicon substrates by a filtered arc deposition process. Spectroscopic ellipsometry (SE) in the energy region 1.5-3.5 eV was used to measure the optical properties of the films. X-ray photoelectron spectroscopy (XPS) was used to determine the

Influence of the working electrode metal
Influence of the working electrode metal on the polythiophene structure. Raman and x-ray photoelectron spectroscopic investigations of the aluminium/polythiophene interface
✍ E. A. Bazzaoui; J. Aubard; A. Elidrissi; A. Ramdani; G. Lévi 📂 Article 📅 1998 🏛 John Wiley and Sons 🌐 English ⚖ 329 KB 👁 2 views

Polythiophene Ðlms of di †erent thicknesses were obtained by electrochemical polymerization of thiophene on to oxidizable (Zn, Fe and Al) and noble (Pt) metals. Resonance Raman and x-ray photoelectron analyses indicated, on the one hand, a better structural organization of the Ðlms synthesized on to