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Influence of test capacitor features on piezoelectric and dielectric measurement of ferroelectric films

✍ Scribed by Zhihong Wang, ; Gih Keong Lau, ; Weiguang Zhu, ; Chen Chao,

Book ID: 120291757
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 446 KB
Volume: 53
Category: Article
ISSN: 0885-3010
DOI: 10.1109/TUFFC.2006.1588386

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