✦ LIBER ✦
Influence of TCE concentration in thermal oxidation on reliability of SiC MOS capacitors under Fowler–Nordheim electron injection
✍ Scribed by B.L. Yang; Paul C.K. Kwok; P.T. Lai
- Book ID
- 104057894
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 192 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0026-2714
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