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Influence of Surface Recombination on the Rate of Electron Leakage in Ridge-Waveguide Injection Lasers

✍ Scribed by Wünsche, H.-J. ;Wenzel, H.

Publisher: John Wiley and Sons
Year: 1989
Tongue: English
Weight: 630 KB
Volume: 111
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211110141

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