✦ LIBER ✦
Influence of Source/Drain Residual Implant Lattice Damage Traps on Silicon Carbide Metal Semiconductor Field-Effect Transistor Drain I-V Characteristics
✍ Scribed by J. Adjaye; M.S. Mazzola
- Book ID
- 113847223
- Publisher
- Elsevier
- Year
- 2012
- Tongue
- English
- Weight
- 445 KB
- Volume
- 25
- Category
- Article
- ISSN
- 1875-3892
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