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Influence of SiO2surface passivation on carrier lifetimes in n-type Hg0.7Cd0.3Te

โœ Scribed by J. Schilz; R. Hellos; J. Ziegler

Publisher
Springer US
Year
1994
Tongue
English
Weight
216 KB
Volume
5
Category
Article
ISSN
0957-4522

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