✦ LIBER ✦
Influence of silicon-sapphire interface defects on SOS MESFET behaviour : J. O. Nylander, U. Magnusson, M. Rosling and P. A. Tove. Solid-St. Electron. 31, 1493 (1988)
- Book ID
- 103285013
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 122 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.