Influence of scatter in yield stresses on design stresses at elevated temperature

✍ Scribed by Rolf Sandström; Bo Ivarsson

• Publisher: Elsevier Science
• Year: 1986
• Weight: 598 KB
• Volume: 7
• Category: Article
• ISSN: 0261-3069
• DOI: 10.1016/s0261-3069(86)80008-5

✦ Synopsis

Previous studies of high temperature yield stresses to evaluate design stresses have been used to derive minimum values corresponding to different failure risks. The relation between these minimum values and the amount of data available has been derived. The results have been presented as safety factors in relation to both conventional minimum and average values.