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Influence of reactor radiation on the electrical strength of a thin-film MDM system

✍ Scribed by Yu. A. Burachevskii

Book ID: 112426648
Publisher: Springer
Year: 1977
Tongue: English
Weight: 166 KB
Volume: 20
Category: Article
ISSN: 1573-9228
DOI: 10.1007/bf00892849

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