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Influence of phase transition induced by residual stress on ferroelectric properties of highly (1 0 0)-oriented Pb(Zr0.52Ti0.48)O3 thin films

✍ Scribed by C.Q. Liu; W.L. Li; W.D. Fei; S.Q. Zhang; J.N. Wang

No coin nor oath required. For personal study only.

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Influence of phase transition induced by residual stress on ferroelectric properties of highly (1&#xa0;0&#xa0;0)-oriented Pb(Zr0.52Ti0.48)O3 thin films