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Influence of O2 on EPR spectra of SiO2 surface defects

✍ Scribed by Dr. H.-J. Tiller; Prof. Dr. G. Rudakoff

Publisher: John Wiley and Sons
Year: 1979
Tongue: English
Weight: 182 KB
Volume: 14
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.19790140112

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