Influence of non-systematic reflexions on weak-beam and high-resolution bright-field images in high-voltage electron microscopy

✍ Scribed by Sandström, R. ;Melander, A. ;Eriksson, L.

• Publisher: John Wiley and Sons
• Year: 1974
• Tongue: English
• Weight: 708 KB
• Volume: 26
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210260128