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Influence of near-edge processes in the elemental analysis using X-ray emission-based techniques

โœ Scribed by GURJEET SINGH; SUNIL KUMAR; N SINGH; J GOSWAMY; D MEHTA


Book ID
107588930
Publisher
Springer-Verlag
Year
2011
Tongue
English
Weight
269 KB
Volume
76
Category
Article
ISSN
0304-4289

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