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Influence of Multiple Angled Columnar Defects on Critical Current Density and n–Value in YBCO Thin Films

✍ Scribed by Tetsuro Sueyoshi; Takahiro Nishimura; Takanori Fujiyoshi; Fumiaki Mitsugi; Tomoaki Ikegami; Norito Ishikawa

Book ID: 119345709
Publisher: Elsevier
Year: 2012
Tongue: English
Weight: 303 KB
Volume: 36
Category: Article
ISSN: 1875-3892
DOI: 10.1016/j.phpro.2012.06.212

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