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Influence of multi-hit capability on quantitative measurement of NiPtSi thin film with laser-assisted atom probe tomography

✍ Scribed by T. Kinno; H. Akutsu; M. Tomita; S. Kawanaka; T. Sonehara; A. Hokazono; L. Renaud; I. Martin; R. Benbalagh; B. Sallé; S. Takeno


Book ID
116245478
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
923 KB
Volume
259
Category
Article
ISSN
0169-4332

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