Influence of Lattice Mismatch and Growth Rate on the Decay of RHEED Oscillation in the Case of InGaAs/GaAs Growth

✍ Scribed by Á. Nemcsics; F. Riesz

• Publisher: John Wiley and Sons
• Year: 2001
• Tongue: English
• Weight: 158 KB
• Volume: 36
• Category: Article
• ISSN: 0232-1300
• DOI: 10.1002/1521-4079(200110)36:8/10<1011::aid-crat1011>3.0.co;2-d