Influence of kink effect on noise measurements in InP substrate PHEMTs at microwave frequencies

✍ Scribed by P. Rouquette; D. Gasquet; F. Barberousse; W. De Raedt; Y. Baeyens

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 247 KB
• Volume: 39
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(96)00066-4