✦ LIBER ✦
Influence of emitter edge dislocations on reliability of planar NPN transistors : N. D. Stojadinovic. Microelectron. Reliab.22 (6), 1113 (1982)
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 126 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0026-2714
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