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Influence of Electropolishing Cu and Al Electrodes on Predischarge Phenomena and Breakdown of Vacuum Gaps

✍ Scribed by Moscicka-Grzesiak, H.; Gruszka, H.

Book ID: 114621717
Publisher: IEEE
Year: 1983
Tongue: English
Weight: 750 KB
Volume: EI-18
Category: Article
ISSN: 0018-9367
DOI: 10.1109/tei.1983.298610

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