Influence of dislocations on the performance of 3 to 5 μm Hg1–xCdxTe graded gap photoresistors

✍ Scribed by Malachowski, M. J. ;Piotrowski, J. ;Rogalski, A.

• Book ID: 105381315
• Publisher: John Wiley and Sons
• Year: 1989
• Tongue: English
• Weight: 610 KB
• Volume: 113
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211130226