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Influence of dilute impurities on the evolution of defect cascades in nickel

โœ Scribed by J.S. Vetrano; I.M. Robertson; M.A. Kirk

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
996 KB
Volume
205
Category
Article
ISSN
0022-3115

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## Abstract The origin of the lower minority carrier lifetime in the border region of multicrystalline silicon (mcโ€Si) ingots was investigated. Based on minority carrier lifetime measurements and chemical analyses, distributions of defects and impurities were studied. It is found that the content o