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Influence of different melt processings upon the microstructure and critical current of textured Y123

โœ Scribed by I. Monot; J. Wang; M.P. Delamare; J. Provost; G. Desgardin


Book ID
108025194
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
847 KB
Volume
267
Category
Article
ISSN
0921-4534

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## Measurements of the electrical resistivity, p, and of the critical current, /,, of polycrystalline Y,Ba,Cu,O,\_, samples before and after being melted superficially are presented. The melting was done by heating the samples at 1050ยฐC during a few minutes, and then annealing at 900ยฐC in flowing