Influence of depth resolution on interdiffusion measurements in polycrystalline Cu/Pd multilayers

✍ Scribed by Antoni Bukaluk

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 98 KB
• Volume: 30
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/1096-9918(200008)30:1<597::aid-sia827>3.0.co;2-k