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Influence of crystallographic orientation and layer thickness on fracture behavior of Ni/Ni3Al multilayered thin films

✍ Scribed by Rajarshi Banerjee; Jason P Fain; Peter M Anderson; Hamish L Fraser

Book ID
114386616
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
428 KB
Volume
44
Category
Article
ISSN
1359-6462

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Multilayered Cr-C/a-C:Cr thin films were prepared by using a hybrid technique of combined vacuum cathodic arc/magnetron sputtering/ion beam deposition. The multilayered films consisted of a dense gradient base layer and 10 bi-layers of Cr-C (chromium matrix containing some carbon) and a-C:Cr (amorph