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Influence of channel-deposition conditions and gate insulators on performance and stability of top-gate IGZO transparent thin-film transistors

✍ Scribed by Hsing-Hung Hsieh; Cheng-Han Wu; Chih-Wei Chien; Chang-Ken Chen; Chao-Shun Yang; Chung-Chih Wu

Book ID: 117970358
Publisher: Society for Information Display
Year: 2010
Tongue: English
Weight: 880 KB
Volume: 18
Category: Article
ISSN: 1071-0922
DOI: 10.1889/jsid18.10.796

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