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Influence of Bit-Line Coupling and Twisting on the Faulty Behavior of DRAMs

โœ Scribed by Zaid Al-Ars; Said Hamdioui; Ad J. van de Goor; Sultan Al-Harbi

Book ID
117907736
Publisher
IEEE
Year
2006
Tongue
English
Weight
447 KB
Volume
25
Category
Article
ISSN
0278-0070

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Study of f.c.c, and b.c.c, alloys with various strain-hardening rate were described. Investigation of the effects of changed-path deformation executed at model tension-torsion-tension tests and bar combined drawing processes proved that strain-softening effects are substantial when changed-path defo