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Influence of Annealing Temperature on the Microstructure and Electrical Properties of Indium Tin Oxide Thin Films

✍ Scribed by Chen, Yinzhi; Jiang, Hongchuan; Jiang, Shuwen; Liu, Xingzhao; Zhang, Wanli; Zhang, Qinyong

No coin nor oath required. For personal study only.

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