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Influence of anneal temperature on the mobile ion concentration in MOS structures : G. Greeuw, S. Bakker and J. F. Verwey. Solid-St. Electron.27 (1), 77 (1984)


Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
139 KB
Volume
24
Category
Article
ISSN
0026-2714

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