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Influence of Al content x on hot electron noise in AlxGa 1-xAs n+nn+ devices: comparison with GaAs

✍ Scribed by de Murcia, M.; Richard, E.; Vanbremeersch, J.; Zimmermann, J.


Book ID
114535925
Publisher
IEEE
Year
1994
Tongue
English
Weight
536 KB
Volume
41
Category
Article
ISSN
0018-9383

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