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Influence of accidental impurities and defects on the low-frequency dielectric relaxation in the ferroelectric Cd2Nb2O7

✍ Scribed by N. N. Kolpakova; M. Wiesner; A. O. Lebedev; P. P. Syrnikov; V. A. Khramtsov

Book ID: 110123730
Publisher: SP MAIK Nauka/Interperiodica
Year: 1998
Tongue: English
Weight: 76 KB
Volume: 24
Category: Article
ISSN: 1063-7850
DOI: 10.1134/1.1262243

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