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Inference about reliability parameter with gamma strength and stress

✍ Scribed by Kai Huang; Jie Mi; Zeyi Wang


Book ID
113757574
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
271 KB
Volume
142
Category
Article
ISSN
0378-3758

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An inferential procedure is presented which provides confidence intervals for a future reliability parameter when reliability growth testing is only partially completed. Hypoth- esis tests based on this method are uniformly most powerful unbiased. These results are applicable if (1) the system failu