Inelastic light scattering and X-ray diffraction from thick free-standing porous silicon films

✍ Scribed by A.V. Andrianov; G. Polisski; J. Morgan; F. Koch

• Book ID: 108344804
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 129 KB
• Volume: 80
• Category: Article
• ISSN: 0022-2313
• DOI: 10.1016/s0022-2313(98)00095-7