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Inelastic Electron Tunneling Spectroscopy Study of Thin Gate Dielectrics

✍ Scribed by James W. Reiner; Sharon Cui; Zuoguang Liu; Miaomiao Wang; Charles H. Ahn; T. P. Ma


Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
523 KB
Volume
22
Category
Article
ISSN
0935-9648

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