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Inelastic electron scattering cross-section spectroscopy of GexSi1 −xnanoheterostructures

✍ Scribed by Parshin, A. S.; P’yanovskaya, E. P.; Pchelyakov, O. P.; Mikhlin, Yu. L.; Nikiforov, A. I.; Timofeev, V. A.; Esin, M. Yu.

Book ID
121551972
Publisher
Springer
Year
2014
Tongue
English
Weight
177 KB
Volume
48
Category
Article
ISSN
1063-7826

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✍ Tougaard, Sven 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 847 KB

Quantitative XPS and AES analysis of surfaces requires models to do fast calculations of the energy loss of electrons at any energy as they move in solids of general and non-uniform composition. This is possible with the Universal cross-section that was introduced a decade ago. A critical review is