✦ LIBER ✦
Inductively coupled plasma-induced defects in n-type GaN studied from Schottky diode characteristics
✍ Scribed by W. Nakamura; Y. Tokuda; H. Ueda; T. Kachi
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 182 KB
- Volume
- 376-377
- Category
- Article
- ISSN
- 0921-4526
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